When Dr. Amanda Stadermann loads a meteorite sample into the Department of Earth and Environmental Science’s new scanning ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

Researchers from the National Institute of Standards and Technology (NIST) and KLA Corporation, a provider of inspection and measurement systems for the semiconductor and related industries, have ...

Tescan has introduced the new generation of Tescan CLARA™, an ultra-high-resolution scanning electron microscope for ...

A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

STEM operates by focusing a beam of electrons into a narrow probe that is scanned across a thin specimen. As the electrons interact with the sample, they are either scattered or transmitted. The ...

-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...

Led by Arthur Blackburn, co-director of UVic's Advanced Microscopy Facility, the team developed a novel imaging technique that allowed them to achieve sub-Ångström resolution using a compact, ...

Since the first transmission electron microscope was sold in 1935, microscopes that use electrons--rather than light waves--to image objects have brought into focus levels of detail that were ...