Chip testing has become increasingly complex due to the number of variables impacting designs – from design size and complexity, to high transistor counts on advanced technology nodes, to 2.5D/3D ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
The latest version of Mentor Graphics' TestKompress compression and ATPG generation tool brings significant enhancements in functionality and productivity. One of the most time-consuming aspects of ...
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